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ゲスト さん （ログイン） |
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ゲスト さん （ログイン） |
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"Pitfalls in Diagnostic Cytopathology With Key Differentiating Cytologic Features," published by Springer in 2016, is a practical guide by Von G. Samedi and Thﾃｨrﾃｩse Bocklage designed to help cytopathologists distinguish benign mimics from malignant cells. The text utilizes organ-specific, high-yield diagnostic criteria and visual aids to minimize false-positive diagnoses caused by reactive changes and sampling errors. For more details, visit Springer .
