Published by ASM International and developed by EDFAS, the "Microelectronics Failure Analysis Desk Reference" is a comprehensive, industry-standard guide for identifying root causes of electronic device failures. The 7th edition covers the full failure analysis workflow, including nondestructive inspection, advanced fault localization like LADA and thermography, and destructive physical analysis. For more details, visit ASM International . Microelectronics Failure Analysis: Desk Reference